1. Ben Cardoen, Hanene Ben Yedder, Sieun Lee, Ivan Robert Nabi, and Ghassan Hamarneh. Log-Paradox: Necessary and sufficient conditions for confounding statistically significant pattern reversal under the log-transform. Technical report arxiv.2302.04780, 000 2023. Keyword(s): Microscopy, Processing, Single Molecule Localization, Super Resolution Microscopy, Software and Tools, Statistics, Geometric mean, Log-transform. [bibtex-key = arxiv:2302.04780]

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